Materials Characterization: Introduction to Microscopic and Spectroscopic Methods | 
 enlarge | Author: Yang Leng
Publisher: Wiley
Category: Book
List Price: $110.00
Buy New: $85.00
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Sales Rank: 920013
Media: Hardcover
Number Of Items: 1
Pages: 384
Shipping Weight (lbs): 1.6
Dimensions (in): 10 x 6.9 x 0.9
ISBN: 0470822988
Dewey Decimal Number: 620.11
EAN: 9780470822982
ASIN: 0470822988
Publication Date: June 2, 2008
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Shipping: International shipping available
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Product Description
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
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