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| Residual Stress Measurement by X-Ray Diffraction 2003 |  | Publisher: Society of Automotive Engineers Inc Category: Book
Buy New: $89.95
New (2) from $89.95
Sales Rank: 3041674
Media: Paperback Pages: 96 Shipping Weight (lbs): 0.5 Dimensions (in): 10.6 x 8.3 x 0.3
ISBN: 0768010691 Dewey Decimal Number: 629 EAN: 9780768010695 ASIN: 0768010691
Publication Date: February 2003 Shipping: Eligible for Super Saver Shipping Promotion: Save $5.00 when you spend $25.00 or more on Qualifying Items offered by Amazon.com. Enter code BMLSAVES at checkout. Terms and Conditions Availability: Usually ships in 24 hours
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